±¨¸æÌâÄ¿£º¼¯³Éµç·µÄ±³¾°¡¢ÏÖ¿ö¡¢Õ¹ÍûÓë¿É¿¿ÐÔ
±¨ ¸æ ÈË£ºÁõ¿¡½Ü£¨µçÆøÓëÐÅÏ¢¹¤³ÌÑ§ÔºÌØÆ¸½ÌÊÚ£¬²©Ê¿Éúµ¼Ê¦£©
±¨¸æÊ±¼ä£º2023Äê5ÔÂ10ÈÕ£¨ÐÇÆÚÈý£©ÉÏÎç9£º30
±¨¸æµØµã£ºA313
Ö÷°ìµ¥Î»£º¿Æ¼¼´¦£¬Ñо¿Éú²¿£¬µçÆø¹¤³ÌѧԺ
Áõ¿¡½Ü£º1987Äê»ñµÃÃÀ¹ú·ðÂÞÀï´ï´óѧµç×Ó¹¤³Ìרҵ²©Ê¿Ñ§Î»£¬ÊDZ±·½Ãñ×å´óѧµçÆøÓëÐÅÏ¢¹¤³ÌÑ§ÔºÌØÆ¸½ÌÊÚ/²©µ¼£¬¹ú¼ÒÌØÆ¸×¨¼Ò£¬½ÌÓý²¿º£ÍâÃûʦ£¬IEEE/IET Fellow£¬IEEE EDS¸±Ö÷ϯ£¬IEEE EDS²ÆÕþίԱ»áµÄÖ÷ϯ¡£Áõ¿¡½Ü½ÌÊÚ³¤ÆÚÖÂÁ¦ÓÚ¾²µç·À»¤£¨ESD£©Éè¼ÆÓë·ÂÕæ¡¢°ëµ¼ÌåÆ÷¼þ½¨Ä£ºÍRFÆ÷¼þµÄÄ£ÐÍÓë·ÂÕæµÈÁìÓòµÄÑо¿£¬Êǹú¼ÊÉÏESDÁìÓòµÄȨÍþÖ®Ò»¡£ÔÚ¹ú¼ÊÖøÃû¿¯ÎïÉÏ·¢±íÆÚ¿¯ÂÛÎÄ320¶àƪ£¬»áÒéÂÛÎÄ250¶àƪ£¬h-index:40£¬³ö°æ×¨ÖøºÍ½Ì¿ÆÊé13²¿£¬»ñµÃרÀû18Ïî¡£Æä×÷ΪµÚÒ»×÷Õß·¢±íÔÚµç×ÓÁìÓò×îȨÍþµÄÆÚ¿¯Proceedings of the IEEEÉϵÄ20Ò³ÂÛÎÄ¡°ESD in Semiconductor Devices: An Overview¡±ºÍ23Ò³ÂÛÎÄ¡°ESD in Semiconductor Devices: Protection Techniques¡±±»IEEEÆÀΪĿǰESDÁìÓò¾µäµÄÆÀÊöÂÛÎÄ¡£
½ìʱ»¶Ó¹ã´óʦÉú»ý¼«²Î»á¡¢½»Á÷£¡



